CHAMBER
JST 챔버 용도 및 특장점
- High Speed DRAM 검사시 온도 환경을 제공하는 챔버.
- 극저온/초고온/고 발열칩 대응 가능.
- Auto Door/Auto Contact/AGV를 이용한 Full Auto 기능 내장. (특허 보유)
- Auto Temperature Calibration 기능(Option)
- Energy Saving Operation(Option)
High Speed NAND Sample Test용
ITEM | SPECIFICATION | |
---|---|---|
Construction | Chamber Quantity | 8 Chamber |
Slot | 32 Slot, 16Slot/Chamber | |
Chamber Door | Auto Door, Auto Lock | |
BIB Board Slot Contact | Auto Contact | |
Dimension | W10000 x D1920 x H2250 | |
Weight | 10,800kg | |
Temperature | Operating Temp Range | -40℃~125℃ |
Heat Load |
1.5 Kw @ 4 Slot x 8 Zone = 12 Kw |
|
Temp. Uniformity / Load | ±3.0℃ / 1.5kW | |
Heating & Cooling Time |
40℃ to 125℃ ≤ 60 min 125℃ to -40℃ ≤ 60 min |